Xrf Analyzer for Sapphire Single Crystal

 Product DescriptionIt can qualitative and quantitation analysis among different materials except element C, also, the apparatus can performance well in Mg,Al,Si,S,P, and Mn which other machine can\'t work well. It mainly applied in the following fields, such as steel,  fireproofing, non-ferrous industry, the qual

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 Product Description
It can qualitative and quantitation analysis among different materials except element C, also, the apparatus can performance well in Mg,Al,Si,S,P, and Mn which other machine can't work well. It mainly applied in the following fields, such as steel,  fireproofing, non-ferrous industry, the quality department, the plating thickness testing, ROSH inductor analysis etc.

Main Features

(1).Accurate: Test results can be close to test wet chemical methods.

(2).Quick speed: Testing large amounts elements in the sample only need few minutes.

(3).Non-loss: It can't damage the physical and chemical properties in sample.

(4).Visually: Analysis results are present directly in graph.

(5).Environment: It can not pollute the environment.
 Main technical parameter

Analysis elementsNa-U,Mainly are Al,Si,P,S,K,Ca,Ti,V,Fe,Ni,Mn,Pb,Zn,Cu,Sn,Sb,As etc
analysis range1 ppm-99.99%
measuring timeAll the contents analysis only in 1-2 minutes
analysis precisionStandard deviation ≤0.08%
analysis errorUp to the normal requirments
radiation dosage<25  μ sv/h
environment temperature15 ºC-35 ºC
 Main allocation

(1). Detection system

 Detector

 Type: electric refrigeration SDD detector

 Be window thickness: 50um

 The best resolution: 130eV

 Energy response range: 1keV-50keV

(2).X light tube (for X ray spectrometer)

 Voltage: 0~ 50kV

 Maximum current: 1.0mA

 Maximum power: 50W

 Filament voltage: 2.0V

 Filament current: 1.7A

 Ray out angle: 12 °

 Target: Mo

 Be window thickness: 0.5mm

(3).High-voltage power supply

 Input voltage: DC+24V ± 10%

 Input current: 4.0A ( maximum )

 Output voltage: 0-5KV & 1mA

 Maximum power: 50W

 Voltage regulation rate: 0.01% ( from no load to full load)

 Current adjustment rate: 0.01% ( from no load to full load)

 Ripple factor: 0.1% ( P-P value)

 The stability of 8 hours: 0.05%

(4). Vacuum pump

 Vacuum: vacuum test 20Pa limit vacuum 2Pa

 (5). Optical integration design / system / vacuum cavity radiation protection

 X light tube, detector, the composite filtertreatment system, CCD, positioning system, automatic collimator switching system processor optical path are integrated in a closed structure, ensure the stability of optical system with a closed optical path system as a vacuum cavity, through the loop and the maze effectively by using X ray maximum energy at the same time to ensure the ray zero overflow.
Xrf Analyzer for Sapphire Single Crystal
 Packing & Shipping
Optical Emission Spectrometers for Metal Analysis Spark Oes
Xrf Analyzer for Sapphire Single Crystal
Xrf Analyzer for Sapphire Single Crystal
Xrf Analyzer for Sapphire Single Crystal
Xrf Analyzer for Sapphire Single Crystal
Xrf Analyzer for Sapphire Single Crystal


 

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